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Optical Image Processing using Eulerian Amplification

Dominic Wood
4Digital grading company AB
Umer Sufan
Digital grading company AB
Cesar Villamil
Digital grading company AB
Dr Richard Wood
Digital grading company AB

Submission to VIJ 2024-10-08

Keywords

  • Optical Image Processing, Eulerian Amplification, Digital Photography, Image Defect Detection, Color Resolution, Pixel Analysis, Gaussian Pyramid, Neural Networks, Small-Amplitude Variations, Machine Learning

Abstract

Recent advancements in digital photography, particularly through mobile phone cameras, microscopes, and satellite imaging, have made high-resolution image capture increasingly accessible. However, these captured images often contain subtle changes in color resolution and density that are challenging to observe with the naked eye. This study explores the application of Eulerian amplification as a method to detect and enhance such small-amplitude variations, making them visible for improved analysis. Unlike traditional approaches, Eulerian methods are particularly effective for processing smooth structures and high-quality printed materials where minor amplifications in color can reveal significant grading details.

Using a pixel-by-pixel Eulerian path analysis, this method allows for a detailed comparison of color intensity values on a fine 8-bit scale, which ranges from 0 to 255. Through this analysis, color distribution patterns are visualized across the spatial structure of the image, which is particularly beneficial for identifying specific variations in quality in printed materials, such as highly graded cards. To manage large image structures, spatial decomposition using a multi-level Gaussian pyramid technique is employed. By applying temporal filtering within select frequency bands (0.4–4 Hz) at a coarse pyramid level, the algorithm effectively pools spatial data, enabling the detection of color density shifts that may indicate image defects.

The amplified image data is further processed using a classifier neural network, which provides high sensitivity and specificity in detecting edge defects, image centering issues, scuffs, and breakages. The system demonstrates promising results in identifying true positives while maintaining low false-negative rates, thus confirming the reliability of deep machine learning algorithms in high-sensitivity defect detection. This paper presents the significance of Eulerian amplification in optical image processing, offering a robust tool for precise, automated defect detection across a variety of high-resolution image types.

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